Thin Film Diffraction

BL17-2 is a high-brightness, in-vacuum undulator (IVU) hard x-ray beamline (~ 5-18keV) optimized for materials scattering applications.

Beam line 11-3 is a fixed energy (E = 12.7 keV, λ = 0.9763 Å) wiggler side station dedicated to wide-angle X-ray scattering techniques (WAXS). The beam line specializes in grazing-incidence geometry measurements, but transmission geometry measurements are also available upon request. The high flux of the instrument paired with a Rayonix MX225 CCD area detector enables rapid data acquisition across variable q-ranges for in situ/operando X-ray scattering measurements.

Beam line currently closed for upgrade.

Beam line 10-2 is a wiggler-based source that splits time between the front hutch (BL10-2a), instrumented for wide-angle X-ray scattering, and the rear hutch (BL10-2b), instrumented for X-ray spectroscopy with a focus on in-situ, time-resolved catalyst characterization.

Beamline 2-1 is used for structural studies across a range of materials systems focused on powder diffraction and reflectivity. In addition to high throughput, high resolution diffraction data the beamline can accommodate highly customized in situ and operando configurations. The beamline is frequently used to study electrochemical reactions, material response to variable temperatures or gas environments, and other user-defined setups.