BL16-2
Beamline 16-2 is dedicated to characterization of X-ray detectors and X-ray optics and dispersive components. It is equipped with a theta/2 theta system, motorized x,y,z motion sample adjustment with manual tilt adjustment, two in-vacuum JJ slit assemblies, 3 different detectors (IRD silicon photodiode, windowless Amptec SDD, and a Amptec SDD with a 0.3 micron Be window). Data acquisition is performed using a custom LabView interface.