Overview
High Resolution Hard X-ray Spectroscopy 56-pole, 0.9-Tesla wiggler, 1.2 mrad acceptance Wiggler End-Station
Beam line 6-2b is a wiggler end-station dedicated to High Resolution Hard X-ray Spectroscopy. The end station combines three multicrystal Johann spectrometers that enable X-ray Emission Spectroscopy (XES), Resonant Inelastic X-ray Scattering (RIXS), High-Energy Resolution Fluorescence Detected X-ray Absorption Spectroscopy (HERFD-XAS) and X-ray Raman Spectroscopy (XRS) techniques. The ambient pressure operation of the end-station provides high flexibility in implementing various sample environments (in-situ, cryogenic, He-atmosphere, furnaces, liquids, high pressurized cells, etc.). A dedicated LHe cryostat allows for routine low temperature measurements. End station is operating with a focused x-ray beam of ~0.15x0.4 (VxH) mm2 and a flux of 2x1013 (4x1012) when a Si(111) or Si(311) monochromator is used, respectively.
The ambient pressure operation of the end-station provides high flexibility in implementing various sample environments (in-situ, cryogenic, He-atmosphere, furnaces, liquids, high pressurized cells, etc.). A dedicated LHe cryostat allows for routine low temperature measurements. This end station operates with a focused x-ray beam of ~0.15x0.4 (VxH) mm2 and a flux of 2x1013 (4x1012) when a Si(111) or Si(311) monochromator is used, respectively.
Sample Environment —
| Ambient pressure experiments | He chamber(s), flexibility with various in-situ setups, liquid samples, high pressure. Dedicated LHe cryostat (4-200 K). |
|---|---|
| Minimum sample requirement (in terms of concentration): Depends strongly on the technique and the scientific question. Please contact responsible scientific staff for guidance. |
Instrumentation —
| Detectors | Silicon-based, single element Vortex solid-state. |
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| Cryostat | Oxford LHe cryostat (4-200 K) |
| Spectrometer | 7-crystal spectrometer for XES, RXES, RIXS, IXS |
| 40-crystal and 14-crystal spectrometers for for IXS at low momentum transfer and 14-crystal analyzer spectrometer for IXS at high momentum transfer | |
| Other | Integrated shutter system and variable filters to alleviate radiation damage. |
Specifications
Technical Specifications
Energy —
| Monochromator | Energy Range | Resolution ΔE/E | Spot Size | Flux |
|---|---|---|---|---|
| Si(111) | 4000-18200 eV | 1 x 10-4 | 0.15 x 0.4 mm2 | 2 x 1013 |
| Si(311) | 4000-18200 eV | 3 x 10-5 | 0.15 x 0.4 mm2 | 3 x 1013 |
Optics —
| M0 Mirror | M1 Mirror | Monochromator |
|---|---|---|
| Bent flat single-crystal Si, Rh coated 10-18.2 keV cutoff, vertically collimating | Bent cylindrical single-crystal Si, Rh coated, standard focus | LN2 cooled, Si(111), ϕ = 0o , Si(311), ϕ = 0o. double-crystal. |
Absorption —
| 127 μm Be |
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