| Tuesday, May 16 | ||
|---|---|---|
| 8:00-8:30 | Coffee and light refreshments | |
| 8:30-8:40 | Welcome and introductory comments (J. Bargar) | |
| 8:40-9:25 | Introduction to SR-based scattering techniques (M. Toney) | |
| 9:25-10:10 | What use is reciprocal space? An introduction (J. Bargar) | |
| 10:10-10:30 | Coffee break & group photo | |
| Guided Q&A sessions: A practical users' guide to planning and conducting scattering measurements | ||
| 10:30-11:15 | Choosing a beam line for your experiment: Optics at SSRL scattering lines (T. Rabedeau) | |
| 11:15-11:40 | Data collection strategies (S. Brennan) | |
| 11:40-12:00 | Detectors for scattering measurements (S. Brennan) | |
| 12:00-1:30 | Lunch (not provided - time is alloted fro participants to go off-site, if desired) | |
| 1:30-2:15 | Using reciprocal space for your measurements (A. Mehta) | |
| 2:15-2:30 | Coffee break | |
| Parallel sessions addressing technical aspects of techniques | ||
| Bulk-Structure Techniques | Surface/Thin Film Techniques | |
| 2:30-3:15 | Structure characterization, including Rietveld (A. Mehta) | Thin film scattering (A. Vailionis) |
| 3:15-4:00 | In-situ scattering, including biominerals (S. Webb) | Reflectivity and thin films (M. Toney) |
| 4:00-4:45 | Amorphous materials (T. Huffnagel) | Interface x-ray scattering (T. Trainor) |
| Wednesday, May 17 | ||
| Techinal aspects session, continued | ||
| 8:00-8:30 | Coffee and light refreshments | |
| 8:30-9:15 | SAXS (J. Pople) | |
| Beam Line Practical Session attendance capped to first 20 registrants | ||
| 9:30-12:30 | Morning concurrent hands-on practical sessions: | |
| BL 1-4 | SAXS | J. Pople |
| BL 2-1 | High resolution powder diffraction | A. Mehta |
| BL 10-2 | Surface/exitaxial film scattering | S. Brennan |
| BL 11-3 | Thin film diffraction with area detectors | M. Toney |
| 12:30-1:30 | Lunch(not provided) Note: sessions resume promptly at 1:30. | |
| 1:30-4:30 | Afternoon concurrent hands-on sessions: | |
| BL 1-4 | SAXS (repeat of morning session) | J. Pople |
| BL 10-2 | High resolution thin film diffraction | M. Toney |
| BL 11-3 | In-situ powder diffraction w/area detectors | S. Webb & A. Mehta |