Yijin Liu, SSRL
The most substantial advancements in X-ray imaging techniques in the past decades are closely related to the availability of the advanced X-ray sources (e.g. synchrotrons) and the development of advanced X-ray optics. The combination of the X-ray energy scanning and the full-field imaging technique has been demonstrated and recognized as a powerful tool for materials science studies. This new functionality provides significant additional chemical information to the 3D geometry of the sample which is available through conventional X-ray tomography techniques.
Detailed description of this powerful technique will be presented, as well as several scientific case studies, including 4D (x, y, z, Energy) visualization/quantification of CZTSe photovoltaic thin film with elemental/chemical sensitivity (see figure 1 below) and 5D (x, y, z, Energy, Pressure) analysis of pressure induced phase transition in BiNiO3 (which renders the changes of the morphology and the chemical distribution as a function of external pressure, as shown in figure 2 below). The presented method is expected to have significant impact on the application of X-ray imaging in materials science.
