Beamline 16-2 is dedicated to characterization of X-ray detectors and X-ray optics and dispersive components. It is equipped with a theta/2 theta system, motorized x,y,z motion sample adjustment with manual tilt adjustment, two in-vacuum JJ slit assemblies, 3 different detectors (IRD silicon photodiode, windowless Amptec SDD, and a Amptec SDD with a 0.3 micron Be window). Data acquisition is performed using a custom LabView interface.
| Status | Off-Line |
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| Supported Techniques | X-ray Metrology |
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| Main Scientific Disciplines | Detector Development |
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| Beam Line Specifications | |||||||||||||||||||
Source1.3 Tesla Bend Magnet, 1.8 mrad angular acceptance
OpticsVariable bend toroidal mirror, single crystal silicon, Rh coated over Cr. Monochromator: PGM (850 l/mm, 1100 l/mm, 1500 l/mm gratings), Au, Rh, and C coated plane mirror Absorption |
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| Instrumentation | - |
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| Sample Environment | 5x10-7 Torr vacuum, inside a 1-meter diameter pancake chamber. Approximate one-meter diameter access door. |
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| Data Acquisition and Analysis | Labview, data acquisition performed on users own system. |
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| Beam Line Phone | 650-926-5162 . On-site Users: Contact the Duty Operator at 9-926-4040 |
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| Beam Line Contact | |||||||||||||||||||
