Speaker: Tim Maxwell, Accelerator Directorate
Program Description
Analysis of single-shot, lasing-induced changes of the longitudinal electron bunch properties has proven invaluable for fs-scale reconstruction of otherwise difficult to measure x-ray FEL pulse profiles. In this talk, we report on measurements following the installation of an X-band transverse deflecting mode cavity (XTCAV) at the LCLS. Limitations of the FEL pulse profiling technique will be discussed, and an unprecedented 1 to 3 fs RMS time resolution of electron bunch and x-ray pulse profiles is demonstrated. Applications in the LCLS performance and capability improvement programs are also shown including short bunch generation and the most recent two color lasing scheme. The new tool is proven as a powerful diagnostic in support of user experiments and machine studies.
