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27th Annual
Stanford Synchrotron Radiation Laboratory
Users' Meeting

Stanford, California  USA
October 18-21, 2000


Four workshops will be held concurrently on Wednesday, October 18, and one will be held on Saturday, October 21. Each will last approximately 6-8 hours. Locations are to be determined. Please check back as workshop programs develop over the next several months.

Please note: Although the same registration form is used for the Users' Meeting and associated workshops, prospective workshop attendees are not required to register for and attend the Users' Meeting as well.

October 18 Workshops

Application of Synchrotron Techniques to Materials Issues in Art and Archeology

Russell Chianelli & Nicholas Pingitore (University of Texas at El Paso) & Herman Winick (SSRL)

Materials -- bones, artifacts, artwork -- lie at the heart of both archaeology and art conservation. Synchrotron radiation techniques provide powerful new ways to interrogate these records of our physical and cultural past -- if we know the right questions to ask and how to ask them. The purpose of this workshop is to discuss and explore the current and potential applications of synchrotron science to problems in archaeology and art conservation. Bringing together key members of the synchrotron and archaeology/art communities, the interdisciplinary workshop will report their latest research accomplishments, highlight ongoing projects, and catalyze new interactions between these fields.

Program     -     Register

Sulfur K-edge X-ray Absorption Spectroscopy: Applications, Opportunities and Future Directions in the Biological, Environmental and Chemical Sciences

Graham George & Ingrid Pickering (SSRL)

Sulfur plays essential roles in biology and in the environment. Despite this, its roles are only partially understood because there are few tools for studying this element in situ. X-ray absorption spectroscopy provides a unique method of probing at this important element.

Applications of the sulfur K-edge spectroscopy in the biological, environmental and chemical sciences will be discussed, and the future of sulfur XAS under SPEAR3 will be addressed.

Program     -     Register

Soft X-ray Speckles: Nanoscale Dynamics in Liquids and Solids

Stephen Kevan (University of Oregon) & Jan Lüning (SSRL)

Transverse coherence is likely to be the least explored property of synchrotron radiation, and only very recently have a few groups started to take advantage of it. One promising application is x-ray dynamic light scattering (or photon correlation spectroscopy) which as a photon-in/photon-out technique can be applied to a wide variety of sample systems in various environments and applied fields. The goal of this workshop is to gain an overview about experience obtained using soft x-rays for dynamic scattering and to discuss future developments. Also, experimental needs will be addressed which is of importance in view of the new soft x-ray capabilities at SSRL with SPEAR3.

Call for Abstracts   Program     -     Register

New Scientific Opportunities in Ultra-high Resolution Spectroscopies: from Nanomaterials to Complex Quantum Systems

Christopher Chidsey, Robert Laughlin (Stanford University), Z.-X. Shen, (SSRL/Stanford University) & Changyoung Kim (SSRL)

The SSRL storage ring will soon be upgraded to a third generation ring, providing exciting new opportunities for scientific research in the UV range. The focus of the workshop is on the area of ultra-high resolution spectroscopy using 10-300 eV photons. The aim of the workshop is to explore and identify scientific themes that are important and ready to benefit from the SPEAR3 upgrade, and to identify the best beam line configuration to serve the interests and need of the research community.

Program     -     Register

The following workshop is co-sponsored by SSRL and the Advanced Light Source (ALS)
and will be held at the ALS on October 18.

Sub-Micron Resolution X-ray Diffraction and Its Application to Problems in Materials Science

Nobumichi Tamura (ALS), Sean Brennan (SSRL) & Jim Patel (SSRL/ALS)

X-ray diffraction using sub-micron white and monochromatic beams has been recently made possible by the development of high brilliance third generation synchrotron sources and progress in x-ray micro-focusing technologies. Among the many applications in the field of Materials Science and Technologies, the ability to probe single grains in thin film and patterned Structures can provide structural and strain information not possible with other techniques.

The purpose of the workshop is to present the possibilities now available using x-ray microbeams as a new characterization tool and to identify new potential applications and areas that would broaden the range of applicability of this technique.

PROGRAM     -    Registration for this workshop is being handled through the ALS

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Last Update: 29-Jul-2000
Page Content: L. Dunn
Page Editor: L. Dunn