Stanford Synchrotron Radiation Laboratory
Four workshops will be held concurrently on Wednesday, October 18, and
one will be held on Saturday, October 21. Each will last approximately
6-8 hours. Locations are to be determined. Please check back as workshop
programs develop over the next several months.
Please note: Although the same
registration form is used for the Users' Meeting
and associated workshops, prospective workshop attendees are not required to
register for and attend the Users' Meeting as well.
October 18 Workshops
of Synchrotron Techniques to Materials Issues in Art and Archeology
Russell Chianelli & Nicholas Pingitore (University of Texas at
El Paso) & Herman Winick (SSRL)
Materials -- bones, artifacts, artwork -- lie at the heart of both archaeology
and art conservation. Synchrotron radiation techniques provide powerful
new ways to interrogate these records of our physical and cultural past
-- if we know the right questions to ask and how to ask them. The purpose
of this workshop is to discuss and explore the current and potential applications
of synchrotron science to problems in archaeology and art conservation.
Bringing together key members of the synchrotron and archaeology/art communities,
the interdisciplinary workshop will report their latest research accomplishments,
highlight ongoing projects, and catalyze new interactions between these
Sulfur K-edge X-ray Absorption Spectroscopy: Applications,
Opportunities and Future Directions in the Biological, Environmental and
Graham George & Ingrid Pickering (SSRL)
Sulfur plays essential roles in biology and in the environment. Despite
this, its roles are only partially understood because there are few tools
for studying this element in situ. X-ray absorption spectroscopy
provides a unique method of probing at this important element.
Applications of the sulfur K-edge spectroscopy in the biological, environmental
and chemical sciences will be discussed, and the future of sulfur XAS under
SPEAR3 will be addressed.
Soft X-ray Speckles: Nanoscale Dynamics in Liquids and
Stephen Kevan (University of Oregon) & Jan Lüning (SSRL)
Transverse coherence is likely to be the least explored property of
synchrotron radiation, and only very recently have a few groups started
to take advantage of it. One promising application is x-ray dynamic
light scattering (or photon correlation spectroscopy) which as a
photon-in/photon-out technique can be applied to a wide variety of sample
systems in various environments and applied fields.
The goal of this workshop is to gain an overview about experience obtained
using soft x-rays for dynamic scattering and to discuss future
developments. Also, experimental needs will be addressed which
is of importance in view of the new soft x-ray capabilities at SSRL
Call for Abstracts
New Scientific Opportunities in Ultra-high Resolution Spectroscopies:
from Nanomaterials to Complex Quantum Systems
Christopher Chidsey, Robert Laughlin (Stanford University), Z.-X. Shen,
(SSRL/Stanford University) & Changyoung Kim (SSRL)
The SSRL storage ring will soon be upgraded to a third generation ring,
providing exciting new opportunities for scientific research in the UV range.
The focus of the workshop is on the area of ultra-high resolution spectroscopy
using 10-300 eV photons. The aim of the workshop is to explore and identify
scientific themes that are important and ready to benefit from the SPEAR3
upgrade, and to identify the best beam line configuration to serve the
interests and need of the research community.
The following workshop is co-sponsored by SSRL
and the Advanced Light Source (ALS)
and will be held at the ALS on October 18.
Sub-Micron Resolution X-ray Diffraction and Its Application
to Problems in Materials Science
Nobumichi Tamura (ALS), Sean Brennan (SSRL) & Jim Patel (SSRL/ALS)
X-ray diffraction using sub-micron white and monochromatic beams has been
recently made possible by the development of high brilliance third generation
synchrotron sources and progress in x-ray micro-focusing technologies. Among
the many applications in the field of Materials Science and Technologies, the
ability to probe single grains in thin film and patterned Structures can
provide structural and strain information not possible with other techniques.
The purpose of the workshop is to present the possibilities now available
using x-ray microbeams as a new characterization tool and to identify new
potential applications and areas that would broaden the range of applicability
of this technique.
- Registration for this workshop is being
handled through the
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Last Update: 29-Jul-2000