Second Annual SSRL Workshop on Synchrotron X-ray Scattering Techniques in Materials and Environmental Sciences Theory and Application
Tuesday, May 15 - Thursday, May 17, 2007 |
Tuesday, May 15 |
| 8:00 - 8:50 |
Registration, with coffee and light refreshments |
| 8:50 - 9:00 |
Welcome and introductory comments (J. Bargar) |
| 9:00 - 9:40 |
Introduction to SR-based scattering techniques at SSRL (B. Ingham) |
| 9:40 - 10:20 |
What use is reciprocal space? An introduction (J. Bargar) |
| 10:20 - 10:40 |
Coffee break & group photo |
| 10:40 - 11:20 |
Reciprocal Space-peak widths, intensities, etc. (A. Vailionis) |
| 11:20 - 12:00 |
Everything you wanted to know about SAXS (J. Pople) |
| 12:00 - 1:30 |
Lunch (not provided - time is allotted for participants to go off-site, if desired) |
| Parallel sessions addressing technical aspects of techniques |
| 1:30 - 2:15 |
Bulk-Structure Techniques
Structure characterization,
including Rietveld (A. Mehta)
|
Surface/Thin Film Techniques
Epitaxial Thin film scattering (A. Vailionis)
|
| 2:15 - 3:00
|
In-situ scattering, including biominerals (S. Webb) |
Polycrystalline thin film scattering (M. Toney) |
| 3:00 - 3:30 |
Cookies and refreshments |
| 3:30 - 4:15 |
In-situ scattering using reaction cells(J. Leisch) |
Textured polycrystalline thin film scattering and reflectivity (M. Toney) |
| 4:15 - 5:00 |
Amorphous materials (T. Hufnagel) |
Interface x-ray scattering (T. Trainor) |
Wednesday, May 16 |
| 8:30 - 9:00 |
Coffee and light refreshments |
| 9:00 - 10:00 |
Data collection strategies and/or detectors (S. Brennan) |
| 10:00 - 10:30 |
Beam lines at SSRL (C. Condron ) |
| 10:30 - 11:30 |
SSRL scattering data collection software introduction (A. Mehta) |
| 11:30 - 1:00 |
Lunch (not provided - time is allotted for participants to go off-site, if desired) |
| Beam Line Practical Sessions (3:00 - 3:30 Break) |
| 1:00 - 5:00 |
Afternoon concurrent hands-on practical sessions: |
| BL 1-4 |
SAXS |
J. Pople, E. Schofield |
| BL 2-1 |
X-ray reflectivity |
A. Mehta, J. Leisch |
| BL 7-2 |
Polycrystalline thin film scattering/ powder diffraction in reflection |
B. Ingham, C. Condron |
| BL 11-3 |
Transmission x-ray diffraction with area detector (in-situ) |
S. Webb, J. Bargar
|
Thursday, May 17 |
| Beam Line Practical Sessions |
| 9:00 - 12:30 |
Morning concurrent hands-on practical sessions: |
| BL 1-4 |
SAXS |
J. Pople, E. Schofield |
| BL 2-1 |
High resolution powder diffraction |
B. Ingham, C. Condron |
| BL 7-2 |
Epitaxial thin film scattering |
M. Toney |
| BL 11-3 |
In-situ scattering with area detectors |
A. Mehta, J. Leisch, S. Webb |
| 12:30 - 1:30 |
Lunch (not provided - time is allotted for participants to go off-site, if desired) |
| Beam Line Practical Sessions - Data Analysis Methods |
| 1:30 - 3:00 |
Afternoon part I hands-on practical sessions: |
| BL 1-4 |
SAXS |
J. Pople |
| BL 2-1/7-2
|
High resolution powder diffraction
And thin film scattering from point detector |
A. Mehta, B. Ingham |
| BL 11-3 |
Area detector diffraction (powder) |
S. Webb |
| 3:00 - 3:30 |
Break |
| 3:30 - 5:00 |
Afternoon part II hands-on practical sessions: |
| BL 1-4 |
SAXS |
B. Ingham |
| BL 2-1/7-2
|
High resolution powder diffraction
And thin film scattering from point detector |
A. Mehta, E. Schofield |
| BL 11-3 |
Area detector diffraction (thin films) |
M. Toney |
