Overview: Modern synchrotron-based X-ray scattering (SR-XRS) techniques offer the ability to probe nano- and atomic-scale structures and order/disorder relationships that critically govern the properties of advanced technological and environmental materials. The high collimation, intensity, and tunability of SR allow the investigation of a wide range of materials, including thin films and interfaces, nanoparticles, amorphous materials, solutions, hydrated and disordered bacteriogenic minerals, soils, and highly crystalline materials.
Good planning and a working knowledge of beam lines, in addition to techniques, are keys to conducting successful SR-XRS measurements. This school will provide a practical users’ guide to planning and conducting scattering measurements at SSRL beam lines. The school will cover important techniques, including surface and thin-film scattering, powder diffraction, in-situ x-ray scattering, and amorphous materials. In all cases, we will cover topics that are not commonly addressed in text books or class lectures, but are typically obtained only through on-the-experiment training. The first day of the school (May 15), will be a lecture day.
The school includes two days of hands-on training at SSRL hard x-ray scattering beam lines (May 16 and 17) registration limited to 20 participants). Costs will be $25 for graduate students and $50 for all others.