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Surface Diffraction
Introduction
Surface diffraction refers to diffraction applied to two dimensional,
adsorbed layers, surface reconstruction and relaxation, and buried interfaces;
this area includes a number of methods, including GIXS and reflectivity.
Surface diffraction is frequently used for surface crystallography - the
determination of atomic structure of adsorbed layers and at surfaces and
buried interfaces. This involves intensity measurements of Bragg diffraction
rods (from two dimensional layers) and crystal truncation rods (from surfaces
and interfaces). Surface diffraction is also used in studies of surface
and adsorbed-layer phase transitions.
Instrumentation
Beamline 7-2 is frequently used for surface diffraction measurements and
indeed some of the pioneering surface diffraction measurements were done
on this beamline. Soller slits or fixed slits are commonly used to analyze
the scattered beam (depending on resolution), but for high resolution
a crystal analyzer can be used. It is advantageous to have a flat surface
with an area of about one cm2.
Analysis
For surface crystallography, structural models are used to analyze the
data. Some programs have been written for this (ROD) [1], but often the
user develops the analysis methods. Recently, some progress has been made
in 'direct methods' for surface crystallography [2]. Some details on data
reduction can be found in the references below.
Applications of surface
diffraction
Surface diffraction measurements of solid-liquid interfaces at SSRL have
shed insight into electrocatalysis [3,4]. These experiments have focused
on the interface structure and phase transitions of CO molecules adsorbed
on Pt surfaces in a number of electrolytes. More details can be found
here.
Recently, surface diffraction has been used to determine surface structure
at oxide-aqueous interfaces, such as alumina, barite (BaSO4), and calcite
[5-7]. Such interfaces are relevant to geochemistry.
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Content Owner: Mike Toney |
Page Editor:
Nik Stojanovic |
Page Last Updated: 28 Jun 2010 18:02 PDT |