This school will provide a practical users' guide to planning and conducting scattering measurements at SSRL beam lines. The school will cover important techniques, including surface and thin-film scattering, powder diffraction, in-situ x-ray scattering, and amorphous materials. It will cover topics that are not commonly addressed in text books or class lectures, but are typically obtained only through on-the-experiment training. Modern synchrotron-based X-ray scattering techniques offer the ability to probe nano- and atomic-scale structures and order/disorder relationships that critically govern the properties of advanced technological and environmental materials. Good planning and a working knowledge of beam lines, in addition to techniques, are keys to conducting successful SR-XRS measurements. The goal of the school is to provide this knowledge.

This workshop has been made possible with support by: DOE-BESand DOE-BER.