May 15-17

Participant:

SSRL/SLAC & Stanford University staff
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Please indicate your areas of interest:

In-situ scattering
Amorphous materials
Thin Film scattering
Reflectivity
CTR/interfaces
Environmental
SAXS
Structure characterization (Rietveld)

Registration payments:

The Registration fee includes participation, meeting materials, refreshments during morning and afternoon breaks, and free daily parking at SLAC.

Lunches during the school are not included; there are a number of cafes and restaurants, including the SLAC Linear Cafe near to the school venue, and the schedule will include an appropriate lunch break.

Conference registration fee:
Full fee        $50 
Reduced fee for graduate students        $25 
Waived fee for speakers         $0  
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If you are using a SLAC or
SU account for registrations
please enter it here: