C25 (similar to C23 and C21, but with larger sample window)
Focus Ion Beam Milling
Date: 17.02.04 (DD.MM.YY)
| Feature | Radius target nm [actual] | Mill current (pA) | Mill time (seconds) | Magnification |
| Pinhole | 1000 | 11 | see p60 v3 | |
| Broken Symmetry (square) | none | - | - | |
| Terrace | none | - | - | |
| Reference hole: top | 150 [~300 x 400 nm] | 11 | 17 | 50kX |
| bottom of reference hole | penetrates very elliptical 119x195nm | |||
| Center to center | 4200 nm | |||
Metal Films
| Front side (membrane side) | Pd(200)[Co(12)Pd(7)]_50 Pd(12) angstroms Olav's code: e4196 |
| Back side (pit side) | Cr 2nm/ Au 600nm |
Membrane Specifications
| Size (micrometers) | 200 x 200 |
| Thickness (nm) | 100 |
| Frame size (mm) | 5x5 |
| Frame thickness (micrometers) | 200 |
Comments: The magnetic multilayer and gold were deposited before the FIB was used. Both the sample window and the reference hole were milled during the same session. The sample window is 2 microns in diameter which is larger than normal. A stubborn grain was present when the sample window was milled, this required a great deal of targeted milling on the grain which is detailed on p60 v3. In the end the window has some gold left in the window, but the membrane was not penetrated so the magnetic multilayer was undisturbed.