Conjugated polymers are being developed as the active semiconductor in devices
such as light-emitting diodes, photovoltaic cells, and thin-film transistors
(TFTs) for large-area and low-cost electronics. Vacuum deposited amorphous
silicon is currently used in the TFTs that drive the active matrix liquid
crystal displays (AM-LCDs) on laptops, computer monitors and televisions. TFTs
are also used in disposable electronics such as radiofrequency identification
chips. Solution processible conjugated polymers, such as the polythiophenes,
can be deposited by low cost methods like inkjet and screen printing. The
charge carrier mobility (0.1 cm2/Vs) of the standard polythiophene,
poly(3-hexylthiophene) (P3HT), is just below that of amorphous silicon (0.6
cm2/Vs). To open up more applications and to better compete with
amorphous silicon, the mobility of polymer semiconductors needs to be improved.
The key to improving the mobility is to develop an understanding of the
relationship between polymer morphology and charge transport.
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Figure 1
- a) plane-on and b) edge-on orientation of P3HT.
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Previously, Sirringhaus et al. have used grazing incidence x-ray scattering
(GIXS) (Nature 401, 685 (1999)) to show a correlation between the orientation
of P3HT crystals and the charge carrier mobility. Films with crystals primarily
oriented with their side chains normal to the substrate and the chain backbone
and the p-faces in the plane of the substrate (edge-on) had higher mobility
than those oriented with their p-faces normal to the substrate and the side
chains and chain backbone in the plane of the substrate (plane-on) as shown in
figure 1. Since the p-faces and the chain backbone are the only directions that
transport charge (the side chains are insulators), the edge-on orientation was
said to provide two-dimensional charge transport. Using beamlines 7-2 and 2-1
to study the polymer morphology with GIXS and specular diffraction rocking
curves, a team of researchers from SSRL and Stanford have shown that the
increase in charge transport associated with the transition from edge-on to
plane-on orientation is largely due to changing the nature of the grain
boundaries. Crystals with a plane-on orientation have grain boundaries
terminated with insulating alkyl chains on two sides, effectively blocking
charge transfer to neighboring crystals.
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Figure 2
- a) schematic of orientation of crystals within the film corresponding to the
peak and background of the b) rocking curve of P3HT films. |
Rocking curves showed the unexpected presence of highly oriented grains in the
polymer films (figure 2). These grains were oriented within 0.03 degrees of the
substrate normal (resolution of the instrument). Conventional understanding for
the semicrystalline films would have expected orientation distributions of 5-20
degrees. The highly oriented crystals were shown to have nucleated from the
dielectric substrate, the critical interface where all the current in a TFT
travels. The concentration of these highly oriented crystals was directly
correlated to the charge carrier mobility of P3HT films by varying the surface
modification of the substrate with self-assembled monolayers. Making the
silicon oxide surface hydrophobic by treating it with octadecyltrichlorosilane
gave the best results. The strength of the surface effect on the charge carrier
mobility was dependent on the molecular weight (MW) of the P3HT. Low MW P3HT
exhibited the strongest correlation with surface treatment (1000x) while high
MW P3HT showed very little dependence on the surface treatment. These results
provide a better understanding of the polymer morphology that lead to high
mobility films.
This same team of researchers in collaboration with scientists from Merck
Chemical and the Palo Alto Research Corporation (PARC) have revealed a new
polymer, poly(2,5-bis(3-alkylthiophen-2-yl)thieno[3,2-b]thiophenes)) (PBTTT),
with the highest reported charge carrier mobility (0.7 cm2/Vs) to date, making
it competitive with amorphous silicon. Measurements at SSRL and Stanford showed
the polymer to have the highest crystallinity ever observed for a
semiconducting polymer. The edge-on orientation of the polymer crystals was
enhanced by annealing the films in the liquid crystalline regime. Atomic force
microscope images (figure 3) of these films showed crystal domain sizes on the
order of 200 nm, almost an order of magnitude larger than any previously
observed in semiconducting polymers. The specular diffraction intensity was
also over an order of magnitude higher than the best P3HT films. These results
showed that the films consisted entirely of the highly oriented crystals first
observed in P3HT. The researchers have shown the polymer to have a similar
morphology to what is seen in small molecules despite having polymer chains 40
times longer.
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Figure 3 - Atomic force microscope image of grains of
pBTTT. |
Primary Citations
"Highly Oriented Crystals at the Buried Interface in Polythiophene Thin Film
Transistors", R.J. Kline, M.D. McGehee, M.F. Toney, Nature Materials 5, 222-228
(2006).
"Liquid crystalline semiconducting polymers with high charge carrier mobility",
I. McCulloch, M. Heeney, C. Bailey, K. Genevicius, I. MacDonald, M. Shkunov, D.
Sparrowe, S. Tierney, R. Wagner, W. Zhang, M.L. Chabinyc, R.J. Kline, M.D.
McGehee, M.F. Toney, Nature Materials 5, 328-333 (2006).
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