Multi-modal and multi-scale imaging with nano-focus X-rays

Wednesday, April 15, 2020 - 2:00pm to 3:00pm

Virtual Photon Science Seminar

Speaker: Xiaojing Huang, BNL 

Program Description:

Scanning probe X-ray microscopy simultaneously evokes multiple contrast mechanisms, which carry versatile information and enable a suite of analytical tools to reveal a correlative view of the specimen. At the Hard X-ray Nanoprobe beamline of NSLS-II, we conduct scanning probe measurements using X-ray beams focused down to 12 nm, and collect fluorescence, transmitted scattering and Bragg diffraction signal simultaneously. We characterized the chemical, morphological and crystalline properties of LCO-based cathode particles, which are highly correlated with their electrochemical performance. Challenges on pursuing higher spatial resolution will be discussed, and we’ll present two methods on extending the depth of field without sacrificing resolution.

 

Multi-modal and multi-scale imaging with nano-focus X-rays
Find Stanford Synchrotron Radiation Lightsource on FlickrFind Stanford Synchrotron Radiation Lightsource on YouTubeFind Stanford Synchrotron Radiation Lightsource on Twitter