Speaker: Hongping Yan, SSRL
Program Description
"Understand morphology of organic semiconductors, for better tailoring it"
Morphology dictates performance. To fabricate high performance organic electronics (eg. organic photovoltaics, field-effect transistors etc.), in-depth characterization and understanding of morphology are demanded for new materials design and advanced morphology control. In this talk, I present the use of synchrotron-based techniques, with both soft and hard x-rays, to understand the significance of nanostructure at interfaces and in the bulk of organic electronics.
I also highlight our efforts of using in-situ roll-to-roll printing/solution shearing setup with x-ray scattering techniques to obtain real-time morphology evolving information. The objective is to correlate the in-situ and ex-situ experimental characterizations with computational morphology simulation to establish models that can assist materials and processes design to speed up the pace towards fabricating high performance devices for energy related applications.
References:
[1] H. Yan, B. A. Collins, E. Gann, C. Wang, H. Ade, and C. R. McNeill, ACS Nano 6, 677 (2012).
[2] B. A. Collins, J. E. Cochran, H. Yan, E. Gann, C. Hub, R. Fink, C. Wang, T. Schuettfort, C. R. McNeill, M. L. Chabinyc, and H. Ade, Nat. Mater. 11, 536 (2012).
[3] H. Yan, T. Schuettfort, A. J. Kronemeijer, C. R. McNeill, and H. W. Ade, Appl. Phys. Lett. 101, 093308 (2012).
