Recent Publications

1. S. A. Yoshikawa, J. Nogami, C. F. Quate, and P. Pianetta, Behavior of tellurium on silicon(100), Surf. Sci. 321, p. L183 (1994).

2. X. Yang, R. Cao, J. Li, J. Terry, J. Wu, and P. Pianetta, The epitaxial growth of Ge on Si(100) using Te as a surfactant, in Common Themes and Mechanisms of Epitaxial Growth Symposium, P. Fuoss, et al., Editors(Materials Research Society, Pittsburg, 1994), p. 243.

3. H. Winick, K. Bane, R. Boyce, G. Loew, P. Morton, H.-D. Nuhn, J. Paterson, P. Pianetta, T. Raubenheimer, and J. Seeman, The SLAC soft X-ray high power FEL, Nucl. Instrum. and Meth. 341, p. 326 (1994).

4. H. Winick, K. Bane, R. Boyce, J. Cobb, G. Loew, P. Morton, H. D. Nuhn, J. Paterson, P. Pianetta, T. Raubenheimer, C. Pellegrini, J. Rosenweiz, G. Ttravish, D. Prosnitz, E. T. Scharlemann, K. Halbach, K. J. Kim, R. Schlueter, M. Xie, R. Bonifacio, L. DeSalvo, and P. Pierini, Short Wavelength FEL's using the SLAC Linac, Nucl. Instrum. and Meth. 347, p. 199 (1994).

5. J. Terry, R. Cao, C. Wigren, and P. Pianetta, Photoemission study of Au, Ge, and O2 deposition on NH4F etched Si(111), J. Vac. Sci. Technol. A 12, p. 1869 (1994).

6. C. Streli, P. Wobrauschek, L. W., R. Rieder, H. Aiginger, R. W. Ryon, and P. Pianetta, Total reflection X-ray fluorescence analysis of light elements using synchrotron radiation, Nucl. Instrum. and Meth. 345, p. 399 (1994).

7. P. Pianetta, S. Brennan, N. Takaura, H. Tompkins, A. Fischer-Colbrie, S. Laderman, D. Wherry, and M. Madden. Total Reflection X-ray Fluorescence Spectroscopy Using Synchrotron Radiation for Wafer Surface Trace Impurity Analysis. in Materials Research Society. 1994. Boston.

8. J. Nogami, S. Yoshikawa, J. C. Glueckstein, and P. Pianetta, Boron reconstructed Si(111) surfaces produced by B2O3 decomposition, Scanning Microscopy 8, p. 835 (1994).

9. P. Liu, T. Kendelewicz, T. Labiosa, J. G. E. Brown, and G. A. Parks. X-ray Photoemission and LEED Study of the Reaction of Water with Clean CaO(100) and MgO(100) Surfaces. in Geological Society of America 1994 Annual Meeting. 1994. Seattle, WA.

10. T. Kendelewicz, J. C. Woicik, K. E. Miyano, S. A. Yoshikawa, P. Pianetta, and W. E. Spicer, Structural study of monolayers of Sb on Ge(111) with different surface reconstructions, J. Vac. Sci. Technol. A 12, p. 1843 (1994).

11. A. Herrera-Gomez, T. Kendelewicz, J. C. Woicik, K. E. Miyano, P. Pianetta, S. Southworth, P. L. Cowan, A. Karlin, and W. E. Spicer, Geometrical structure of the Bi/GaP (110) interface: an X-ray standing wave triangulation study of a nonideal system, J. Vac. Sci. Technol. A 12, p. 2473 (1994).

12. A. M. Green, W. E. Spicer, C. Kim, R. Cao, and P. Pianetta, CaF2 overlayers to preserve the ideal termination of Sb-GaAs(110), J. Vac. Sci. Technol. A 12, p. 1158 (1994).

13. A. Fischer-Colbrie, S. S. Laderman, S. Brennan, N. Takaura, P. Pianetta, A. Shimazaki, K. Miyazaki, J. Kortright, and D. C. Wherry. Ultra-trace Metal Analysis of Si Wafer Surfaces using Synchrotron Radiation. in Second International Symposium on Ultra-Clean Processing of Si Surfaces. 1994. Leuven/Maersfoort, Belgium.

14. F. Coffman, P. P. R. Cao, M. K. S. Kapoor, L. J. Terminello, and S. Falabella. Near-edge x-ray absorption of carbon materials for determining bond hybridization. in Materials Research Society Fall Meeting. 1994. Boston, MA.

15. R. Cao, H. Tang, and P. Pianetta. Negative Electron Affinity on GaAs with O2 and NF3. in Gordon Research Conference "Excitation at Semiconductor Surfaces - Fundamental Concepts and Application in Semiconductor Processing". 1994. Hawaii.

16. S. Brennan, W. Tompkins, N. Takaura, P. Pianetta, S. S. Laderman, A. Fischer-Colbrie, J. B. Kortright, M. C. Madden, and D. C. Wherry, Wide Band-Pass Approaches to Total Reflection X-ray Fluorescence Using Synchrotron Radiation, Nucl. Instrum. Meth. 347, p. 417 (1994).

17. J. Terry, C. Wigren, R. Cao, P. Pianetta, M. Linford, and C. E. D. Chidsey. Characterization of alkyl monolayers on NH4F etched Si(111). in American Chemical Society. 1995. Hawaii.

18. N. Takaura, S. Brennan, P. Pianetta, S. S. Laderman, A. Fischer-Colbrie, J. B. Kortright, D. C. Wherry, K. Miyazaki, and A. Shimazaki, Quantitative Consideration of Background Contributions to TXRF Spectra for the case of a Synchrotron Radation X-ray Source, Advances in X-ray Chemical Analysis JAPAN 26, p. 113 (1995).

19. P. Pianetta, S. Brennan, N. Takaura, H. Tompkins, A. Fischer-Colbrie, S. Laderman, D. Wherry, and M. Madden, Total Reflection X-ray Fluorescence Spectroscopy Using Synchrotron Radiation for Wafer Surface Trace Impurity Analysis, Rev. Sci. Instrum. 66, p. 1293 (1995).

20. P. Pianetta. TXRF Ultratrace Element Analysis Using Synchrotron Total External Reflection X-ray Fluorescence. in 22nd Meeting of the Federation of Analytical Chemistry and Spectroscopy Societies. 1995. Cincinnati, OH. 21. Z. H. Lu, S. P. Tay, R. Cao, and P. Pianetta, The effect of rapid thermal N2O nitridation on the oxide/Si(100) interface structure, Appl. Phys. Lett. 67, p. 2836 (1995).

22. S. S. Laderman, A. Fischer-Colbrie, A. Shimazaki, K. Miyazaki, S. Brennan, N. Takaura, P. Pianetta, and J. B. Kortright. Silicon Wafer Trace Impurity Analysis using Synchrotron Radiation. in International Workshop on Semiconductor Characterization. 1995. Gaithersburg, MD.

23. S. S. Laderman, A. Fischer-Colbrie, A. Shimazaki, K. Miyazaki, S. Brennan, N. Takaura, P. Pianetta, and J. B. Kortright, High Sensitivity Total Reflection X-ray Fluorescence Spectroscopy of Silicon Wafers using Synchrotron Radiation, Advances in X-ray Chemical Analysis JAPAN 26, p. 91 (1995).

24. S. S. Laderman, A. Fischer-Colbrie, A. Shimazaki, K. Miyazaki, S. Brennan, N. Takaura, P. Pianetta, and J. B. Kortright, High Sensitivity Total Reflection X-ray Fluorescence Spectroscopy of Silicon Wafers using Synchrotron Radiation, Analytical Sciences 11, p. 515 (1995).

25. S. S. Laderman, Configuration and Performance of Synchrotron Radiation Total External Reflection X-ray Fluorescence, p. (1995).

26. C. Kim, P. Pianetta, and M. A. Kelly, Construction of a new imaging bandpass analyzer for a magnetic projection photoelectron microscope, Rev. Sci. Instrum. 66, p. 3159 (1995).

27. T. Kendelewicz, P. Liu, G. E. Brown, E. J. Nelson, and P. Pianetta. X-ray standing wave and core level photoemission studies of Na and Cs overlayers on MgO(100) (1x1) and TiO2 surfaces. in European Congress on Surface Science. 1995. Lille, France.

28. B. Holloway, W. Tong, D. Shuh, M. A. Kelly, and P. Pianetta. Synthesis and Characterization of High Pressure (~8 Torr) Carbon Nitride. in Applied Diamond Conference. 1995. Gaithersburg, MD.

29. B. Holloway, D. Shuh, W. Tong, M. A. Kelly, and P. Pianetta. Synthesis and Characterization of Carbon Nitride. in Surface and Interface Meeting of the Norther California Chapter of the American Vacuum Society. 1995. Santa Clara, CA.

30. B. Holloway, D. Shuh, W. Tong, M. A. Kelly, and P. Pianetta. Synthesis and Characterization of Amorphous Carbon Nitride. in Users Meeting of the Stanford Synchrotron Radiation Laboratory. 1995. Stanford, CA.

31. A. Fischer-Colbrie, S. S. Laderman, S. Brennan, A. Waldhauer, N. Takaura, P. Pianetta, A. Shimazaki, K. Miyazaki, and D. C. Wherry. Ultra-trace Metal Analysis of Wafer Surfaces using Synchrotron Radiation. in Symposium on Synchrotron Radiation Research. 1995. SRRC, Hsinchu, Taiwan ROC.

32. R. Cao, H. Tang, and P. Pianetta, Negative Electron Affinity on the GaAs(110) with Cs and NF3: a Surface Science Study, SPIE Proceedings 2550, p. 132 (1995).

33. J. C. Woicik, T. Kendelewicz, S. A. Yoshikawa, K. E. Miyano, G. S. Herman, P. L. Cowan, P. Pianetta, and W. E. Spicer, Surface Sensitive X-ray Standing Wave Study of Si(111) ×3x×3-Ag, Phys. Rev. B53, p. 15425 (1996).

34. Z. H. Lu, S. P. Tay, R. Cao, and P. Pianetta, Rapid Thermal N2O oxynitride on Si(100), J. Vac. Sci. Technol. B14, p. 2882 (1996).

35. T. Kendelewicz, P. Liu, G. E. Brown, E. J. Nelson, and P. Pianetta, Photoemission Study of Na and Cs Adsorption on MgO(100)1x1, Surface Science 352-354, p. 451 (1996).

36. B. C. Holloway, D. K. Shuh, M. A. Kelly, W. Tong, J. A. Carlisle, I. Jimenez, D. G. J. Sutherland, L. J. Terminello, P. Pianetta, and S. Hagstrom, Synthesis and Characterization of Amorphous Carbon Nitride Films, Thin Solid Films 290-291, p. 94 (1996).

37. C. A. Fox, M. A. Kelly, S. B. Hagstrom, R. Cao, G. Vegera, P. Pianetta, L. Pan, and W. Hsu, Photoelectron emission from the cesiated diamond (110) surface, in Diamond for Electronic Applications, D. L. Dreifus, et al., Editors(Materials Research Society, Pittsburg, 1996), p. 449.

38. A. Filipponi, A. D. Cicco, P. Pianetta, and T. Kendelewicz, Evidence for [1s2p]3p Shake-up Channels in Compounds and Oxides of Third Period Elements, Phys. Rev. B53, p. 15571 (1996).

39. F. L. Coffman, R. Cao, P. Pianetta, S. Kapoor, M. Kelly, and L. J. Terminello, Near-edge X-ray Absorption of Carbon Materials for Determining Bond Hybridization in Mixed sp2/sp3 Bonded Materials, Applied Physics Letters 69, p. 568 (1996).

40. Y.-L. Chang, R. Cao, W. E. Spicer, P. Pianetta, S. Shi, E. Hu, and J. Merz, Interaction of Hydrogen Ions with Oxidized GaAs(100) and AlAs(100) Surfaces, J. Vac. Sci. Technol. B14, p. 2914 (1996).

41. J. Terry, M. Lindford, C. Wigren, R. Cao, P. Pianetta, and C. Chidsey, Determination of the bonding of alkyl monolayers to the Si(111) surface using chemical-shift, scanned-energy photoelectron diffraction, Applied Phyics Letters 71, p. 1056 (1997).

42. C. Streli, P. Wobrauschek, V. Bauer, P. Kregsamer, R. Gorgl, P. Pianetta, R. Ryon, S. Pahlke, and L. Fabry, Total reflection X-ray fluorescence analysis of light elements with synchrotron radiation an special X-ray tubes, Spectrochimica Acta B 52, p. 861 (1997).

43. C. Streli, P. Wobrauschek, V. Bauer, R. Gorgl, P. Kregsamer, P. Pianetta, and R. Ryon, Synchrotron Radiation Induced TXRF of Light Elements, in Advances in X-ray Analysis1997), .

44. E. J. Nelson, T. Kendelewicz, P. Liu, and P. Pianetta, New surface phases for potassium adatoms on cleaved Si(111), Surface Science 380, p. 365 (1997).

45. Q. Ma, R. A. Rosenberg, C. Kim, J. Grepstad, P. D. Pianetta, T., D. Dunham, and B. Tonner, Comparative magnetic-field imaging, electric-field imaging, and scanning Auger microscopy study of metal-matrix composites, J. Electron. Spect. 84, p. 99 (1997).

46. Q. Ma, R. A. Rosenberg, C. Kim, J. Grepstad, and P. Pianetta, Microscopic chemical state identification of a silicon-carbide fiber by soft X-ray photoabsorption spectroscopy, Applied Physics Letters 70, p. 2389 (1997).