Mike Toney: email@example.com
SSRL Materials Sciences Division (To be implemented)
Bio: Michael F. Toney received his PhD in surface physics from the University of Washington in 1983. He then moved to the Risoe National Laboratory in Denmark, as a NATO Postdoctoral Fellow, where he used surface X-ray diffraction to study semiconductor surface structure. In 1984 he joined the IBM Research Division in San Jose. While at IBM, his research focused on the use of X-ray scattering methods for structure determination of polymer surfaces and of thin films and interfaces that are importance in electrochemistry and in magnetic recording. In 2003, he joined the Stanford Synchrotron Radiation Lighsource (SSRL), where he is presently a senior staff scientist. He has the main responsibility for the x-ray scattering program at this facility and leads a research team that does research on surface and nanoparticle structure and reactivity using synchrotron radiation. Toney is one of the pioneers in the use of surface X-ray diffraction for in-situ investigations of atomic structure at electrode-electrolyte interfaces and of the molecular structure of organic and magnetic thin films.
Mike's first year in grad school.