Overview
Beamline 16-2 is dedicated to characterization of X-ray detectors and X-ray optics and dispersive components. It is equipped with a theta/2 theta system, motorized x,y,z motion sample adjustment with manual tilt adjustment, two in-vacuum JJ slit assemblies, 3 different detectors (IRD silicon photodiode, windowless Amptec SDD, and a Amptec SDD with a 0.3 micron Be window). Data acquisition is performed using a custom LabView interface.
Status —
Beamline Parameters —
| Energy Range | Resolution ΔE/E | Spot Size | Flux | Angular Acceptance | |
|---|---|---|---|---|---|
| Focused | 50 – 2300 eV | ~5 x 10-4 | 1 x 0.45mm | - | 1.8 mrad |
| Unfocused | 50 – 2300 eV | ~5 x 10-4 | 1 x 25mm | > 1010 | 1.8 mrad |
Optics —
| M0 Mirror | Monochromator |
|---|---|
| Variable bend toroidal mirror, single crystal silicon, Rh coated over Cr. | PGM (850 l/mm, 1100 l/mm, 1500 l/mm gratings), Au, Rh, and C coated plane mirror |
Source —
Bend Magnet
Sample Environment —
| 5 x 10-7 Torr vacuum, inside a 1-meter diameter pancake chamber. Approximate one-meter diameter access door. |
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