Precise in-situ measurement of the spontaneous radiation
spectrum from individual undulator segments has the
potential to become an important tool in commissioning
the Undulator System. For the XFEL to work properly,
the strength of each segment must be adjusted
with a relative precision of about 0.01%. This
level of precision will probably require in-situ adjustment.
The workpackage for Undulator Commissioning is aimed at
developing this tool by asking contributors to:
- Present methods for measuring in-situ K-values
or phase errors using spontaneous x-rays from individual
undulator segments.
- Lay out issues that need to be studied, such as finite
beam size, undulator segment imperfections, x-ray
reflections from vacuum chamber walls, near-field issues
associated with differing distances from undulator segment
to measuring apparatus, and jitter in the electron beam
position and energy.
- Describe what machine experiments might be done employing
this technique, such as determining segment alignment, or
measuring the vacuum chamber impedance
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