Experimental Station 13-1

In a scanning transmission x-ray microscope (STXM), spatial resolution is obtained by using zone plate lenses which focus the x-ray beam down to a spot size of 10s of nm. The sample is then scanned perpendicular to the optical axis, while the intensity of the transmitted x-rays is detected at the same time. Such a microscope is currently commissioned at SSRL BL13-1. It will initially provide a spatial resolution of about 35nm, while operating under UHV condition, at temperatures between 25K and 450K, as well as in applied magnetic fields. Because the microscope enables us to study systems in magnetic fields as well as in a wide temperature range, we anticipate that groups interested in research on magnetism and correlated materials will be particularly interested in this type of microscopy.

Status
Commissioning
Type
VUV
Source
Elliptically Polarized Undulator (EPU)
Energy Range

250-1000 eV

% Time General Use
30%
Supported Techniques
Main Scientific Disciplines
Beam Line Specifications
  Energy Range Resolution ΔE/E Spot Size Flux Angular Acceptance
Focused 4000-14500 eV ~5 x 10-4 .0.1 x 0.5 mm2 N/A 0.25 mrad

 

Optics

M0 vertical deflecting spherical, water-cooled
M2 horizontal deflecting spherical

Monochromator

N/A

Detector

N/A

Sample Environment

N/A

Absorption

N/A

Instrumentation

Computer:
Linux and Windows PC
CAMAC Crate:
Hex scaler, real time clock, D/A converter (for spectroscopy)
NIM Electronics:
Voltage to frequency converter (for spectroscopy) 
Sample environment:
UHV, temperature 25-450K and magnetic fields up to 0.25 Tesla

Data Acquisition and Analysis

N/A

Additional Notes

N/A

Beam Line Staff
Beam Line Phone
650-926- . On-site Users: Contact the Duty Operator at 9-926-4040
Engineering Notes
Resource Links
Resource Documents
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