In a scanning transmission x-ray microscope (STXM), spatial resolution is obtained by using zone plate lenses which focus the x-ray beam down to a spot size of 10s of nm. The sample is then scanned perpendicular to the optical axis, while the intensity of the transmitted x-rays is detected at the same time. Such a microscope is currently commissioned at SSRL BL13-1. It will initially provide a spatial resolution of about 35nm, while operating under UHV condition, at temperatures between 25K and 450K, as well as in applied magnetic fields. Because the microscope enables us to study systems in magnetic fields as well as in a wide temperature range, we anticipate that groups interested in research on magnetism and correlated materials will be particularly interested in this type of microscopy.
| Status | Commissioning |
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| Type | VUV |
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| Source | Elliptically Polarized Undulator (EPU) |
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| Energy Range | 250-1000 eV |
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| % Time General Use | 30% |
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| Optics | M0 vertical deflecting spherical, water-cooled |
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| Monochromator | N/A |
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| Detector | N/A |
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| Sample Environment | N/A |
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| Absorption | N/A |
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| Instrumentation | Computer: |
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| Data Acquisition and Analysis | N/A |
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| Additional Notes | N/A |
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| Beam Line Staff | |||||||||||||
| Beam Line Phone | 650-926- . On-site Users: Contact the Duty Operator at 9-926-4040 |
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