XRS 2016 - 8th SSRL School on Synchrotron X-Ray Scattering Techniques
Materials and Environmental Sciences: Theory and Application
June 21-23 2016

This school will provide a practical users' guide to planning and conducting scattering measurements at SSRL beam lines, and will cover important techniques including small angle scattering, thin-film scattering, powder diffraction, structure refinement and surface x-ray scattering. The school will address topics that are not commonly included in text books or class lectures, and typically obtained only through on-the-experiment training. There will be:

• hands-on sessions at SSRL beam lines
• a session of diffraction theory
• a session on diffraction data analysis

The school will also cover new instrumentation at SSRL scattering beam lines.

Organizing Chairs: Apurva Mehta, Kevin Stone, Chris Tassone, Hongping Yan, and Michael Toney

This school has been made possible with support from the DOE-BES.

Agenda: 2016 Agenda

Event Photos: XRS 2016 Flickr Album

Presentations

• Apurva Mehta - Introductory Remarks
• Apurva Mehta - Data Collection Strategy
• Apurva Mehta - Detector Zoology
• Apurva Mehta - Thin Film Diffraction
• Apurva Mehta - What Does a Scattering Pattern Tell Us?
• Jun-Sik Lee - Applications of Resonant Soft X-ray Scattering in Material Sciences
• Hans-Georg Steinrück - X-ray Surface Diffraction & Reflectivity
• Karsten Beuening - Beyond Form Factor Scattering
• Doug Van Campen - Experimental Chambers and Capabilities

Software Packages

Links to some of the appropriate software analysis packages are provided here for reference. Participants do not need to download or install prior to attending the school. Participants will learn which programs are appropriate for various experimental techniques and how to use them during the school.

• GSAS II - Powder diffraction and structure refinement https://subversion.xor.aps.anl.gov/trac/pyGSAS
• WxDiff - Analysis of 2D area detector images Link available soon from Stefan
• Irena and Nika - SAXS data reduction and modeling http://usaxs.xray.aps.anl.gov/staff/ilavsky/nika.html
• GenX - Surface diffraction and reflectivity fitting http://genx.sourceforge.net/
• wxDiff - https://www.dropbox.com/sh/zlujkbucga0ls7e/AADXh9hpLs7ITeJv-4eo9M_La?dl=0