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K. Hämäläinen University of Helsinki, Helsinki, Finland
X-ray spectroscopy with a sub-eV energy resolution can help to resolve subtle
spectral details due to minor chemical changes in the sample. It can also open
up possibilities to even probe previously unrevealed electronic excitations.
Very recently, there have been significant worldwide development efforts to
improve the instrumentation and especially crystal analyzers, whose use has
become feasible due to the increased brightness of third generation synchrotron
sources. At the same time there have been major advances in theoretical and
computational techniques, which have been essential in order to gain
understanding on the complicated high-resolution spectra. These advancements
have given the sub-eV resolution x-ray spectroscopy a possibility to proceed
from pioneering experiments to a useful tool in materials science. The
presentation will give a short introduction to interaction phenomena and the
related theory behind non-resonant and resonant inelastic x-ray scattering
processes. The present status of instrumentation and experimental challenges
will be summarized. Finally, results from several recent highlight experiments
will be shown.
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