SSRL Beam Lines by Number

SSRL Beam Lines by Number
(Operational and in Construction/Planning)

Beam Line	Source	Supported Technique(s)	Energy Range	Status	Contact Person

1-4	Bend	Small anglex-ray scattering Wide angle x-ray scattering	7100-9000 eV	Open	John Pople

1-5	Bend	Macromolecular crystallography: multiple-wave length anomalous diffraction (MAD) and monochromatic	0.85-2.06 Å 6000-14500 eV	Open	Michael Soltis

2-1	Bend	Powder diffraction Thin film diffraction	4000-15800 eV	Open	Apurva Mehta

2-2	Bend	White light station	1000-40000 eV	Open	Bart Johnson

2-3	Bend	X-ray absorption spectroscopy X-ray absorption spectroscopy imaging Instrumentation Development	2400-30000 eV	Open	John Bargar

4-1	Wiggler	X-ray Absorption Spectroscopy	6500-30000 eV	2008	John Bargar

4-2	Wiggler	Macromolecular solution x-ray scattering Lipid membrane diffraction Fiber diffraction Time-resolved x-ray scattering/diffraction Small-angle single crystal diffraction	6000-18000 eV (crystal) 8000-12000 eV (multilayer)	2008	Hiro Tsuruta

4-3	Wiggler	X-ray absorption spectroscopy Soft x-ray absorption spectroscopy	2400-14000 eV	2008	Matthew Latimer

5-4	Undulator	Ultra-high energy resolution photoemission Angle resolved photoemission spectroscopy Angle-Resolved Photoelectron Spectroscopy	10-40 eV	Open	Donghui Lu

6-2a	Wiggler	Soft x-ray absorption spectroscopy X-ray absorption spectroscopy	2050-5000 eV 4000-17000 eV	Open	Serena DeBeer George

6-2b	Wiggler	X-ray microprobe X-ray absorption spectroscopy imaging Total x-ray reflection fluorescence	4000-17000 eV	Open	Sean Brennan

6-2c	Wiggler	X-ray microscopy	4000-17000 eV		Piero Pianetta

7-1	Wiggler	Macromolecular crystallography: restricted-range multiple-wave length anomalous diffraction (MAD) andmonochromatic	1.75-0.93 Å 7000-13500 eV	Open	Michael Soltis

7-2	Wiggler	X-ray scattering X-ray diffraction	5000-20000 eV	Open	Michael Toney

7-3	Wiggler	X-ray absorption spectroscopy	4600-37000 eV	Open	Serena DeBeer George

8-1a	Bend	Photoemission spectroscopy	15-185 eV	Open	Dan Brehmer

8-1b	Bend	Photoemission spectroscopy	15-185 eV	Open	Dan Brehmer

8-2	Bend	X-ray absorption spectroscopy, near edge Photoemission spectroscopy	200-1600 eV	Open	Dan Brehmer

9-1	Wiggler	Macromolecular crystallography: restricted-range multiple-wave length anomalous diffraction (MAD) andmonochromatic	0.76-0.98 Å 12600-16200 eV		Michael Soltis

9-2	Wiggler	Macromolecular crystallography: multiple-wave length anomalous diffraction (MAD) and monochromatic	0.85-2.06 Å 6000-14500 eV	Open	Michael Soltis

9-3	Wiggler	X-ray absorption spectroscopy Single crystal x-ray absorption spectroscopy X-ray absorption spectroscopy imaging	4600-30000 eV	Open	Serena DeBeer George

10-1	Wiggler	X-ray absorption spectroscopy, near edge Photoemission spectroscopy	250-1200 eV	Open	Dan Brehmer

10-2a	Wiggler	X-ray absorption spectroscopy	4500-37000 eV	Open	Serena DeBeer George

10-2b	Wiggler	X-ray scattering	4500-37000 eV	Open	Michael Toney

11-1	Wiggler	Macromolecular crystallography: restricted-range multiple-wave length anomalous diffraction (MAD) and monochromatic	0.82-1.17 Å 10600-15200 eV	Open	Michael Soltis

11-2	Wiggler	X-ray absorption spectroscopy Grazing incidence x-ray absorption spectroscopy	4500-37000 eV	Open	John Bargar

11-3a	Wiggler	Macromolecular crystallography, fixed-energy monochromatic	0.97 Å 12700 eV	Open	Michael Soltis

11-3b	Wiggler	X-ray scattering X-ray diffraction	12700 eV	Open	Apurva Mehta

12-2	Undulator	Macromolecular crystallography: multiple-wave length anomalous diffraction (MAD) and monochromatic Macromolecular crystallography: microdiffraction	0.69-2.47 Å 5000-18000 eV	2007	Michael Soltis

13-1	Elliptically Polarized Undulator (EPU)	Scanning transmission x-ray microscopy	250-1000 eV	2008	Hendrik Ohldag

13-2	Elliptically Polarized Undulator (EPU)	Photoemission spectroscopy X-ray emission spectroscopy	250-1100 eV	2008	Hirohito Ogasawara

13-3	Elliptically Polarized Undulator (EPU)	Coherent soft x-ray scattering	250-1200 eV	2008	Andreas Scherz

14-1	Bend	Macromolecular crystallography: multiple-wave length anomalous diffraction (MAD) and monochromatic	0.83-2.07 Å 6000-15000 eV	2009	Michael Soltis

14-3	Bend	Soft x-ray absorption spectroscopy Soft x-ray absorption spectroscopy imaging X-ray absorption spectroscopy	2050-5000 eV	2009	Serena DeBeer George

Last Updated: 21 APR 2008

Content Owner: Piero Pianetta, Britt Hedman

Page Editor: Nikola Stojanovic